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Tesla reportedly delays AI6 chip multi-project wafer testing at Samsung Electronics' 2nm node

Tesla reportedly delays AI6 chip multi-project wafer testing at Samsung Electronics' 2nm node

金十金十2026/03/10 07:47
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Golden Ten Data reported on March 10 that due to the delay by major client Tesla in the multi-project wafer (MPW) testing of the AI6 chip at Samsung Electronics' 2nm node, Samsung's foundry had to postpone the originally scheduled testing service in April this year by half a year. This has affected the DX-M2 project of the Korean fabless company DEEPX. DEEPX's next-generation on-device generative AI chip will not be able to achieve mass production as planned in Q2 2027. It now appears that quality testing is expected to be completed in Q3 2027, and full-scale sales will only begin in Q4 2027.
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